PFS - New Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity of Complex SoCs
Autor: | Deligiannis, Nikolaos I. |
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Jazyk: | angličtina |
Rok vydání: | 2022 |
Předmět: | |
Zdroj: | UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) |
Popis: | It is well known that during device testing, the switching activity (SWA) of the circuit under test (CUT) is an important parameter that must be retained to a minimal value in order to avoid unwanted scenarios on the CUTs (e.g., over-stressing) that can lead to an artificial yield loss. However, there are scenarios, e.g., during Burn-In testing (BI), where the maximization of the SWA can be proven beneficial by accelerating the aging phenomena of the devices in a safer and better controlled manner. In the frame of my PhD activities, I look for new methods able to automatically generate programs able to maximize the switching activity in a SoC and/or in the single modules within it. I already developed two methods while considering microprocessors as case studies, that automate the generation of stress-inducing stimuli for various units of a pipelined CPU. The first method is based on evolutionary techniques, while the second is based on formal techniques. The microprocessor we considered is the OpenRISC 1200 (OR1200). |
Databáze: | OpenAIRE |
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