Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles

Autor: Azat Slyamov, Peter Stanley Jørgensen, Christian Rein, Odstrčil, M., Jens Wenzel Andreasen
Jazyk: angličtina
Rok vydání: 2019
Zdroj: Slyamov, A, Jørgensen, P S, Rein, C, Odstrčil, M & Andreasen, J W 2019, ' Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles ', 2019 International Conference on Tomography of Materials & Structures, Cairns, Australia, 22/07/2019-26/07/2019 .
Technical University of Denmark Orbit
Popis: Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer films of nanoparticles. Preliminary results on a reconstruction of a test sample are presented. A potential impact for characterization of surface energy, particle size and growth due to Ostwald ripening is expected.
Databáze: OpenAIRE