Influence of energy and charge surface states on degradation properties of powerful silicon avalanche-time-of-flight diodes
| Autor: | Ramizulla Muminov, Malaeva, V. T., Radzhapov, S., Sirozhkov, U., Sapaev, B., Tursunkulov, O. M. |
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| Zdroj: | Scopus-Elsevier |
| Databáze: | OpenAIRE |
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