Ultrafast valley-resolved carrier dynamics in group IV semiconductors
Autor: | Zürch, M, Chang, HT, Borja, LJ, Kraus, PM, Cushing, SK, Gandman, A, Kaplan, CJ, Oh, MH, Prell, JS, Prendergast, D, Pemmaraju, CD, Neumark, DM, Leone, SR |
---|---|
Rok vydání: | 2018 |
Předmět: | |
Popis: | Attosecond transient absorption spectroscopy at the M4,5-edge of Ge following ultrafast photoexcitation reveals valley-resolved hot electron and hole relaxation, carrier recombination and trapping in Ge and Si-Ge alloy in unprecedented clarity and simultaneously. |
Databáze: | OpenAIRE |
Externí odkaz: |