On the use of the EM medium as a fault injection means
| Autor: | Maurine, Philippe, Dehbaoui, Amine, Poucheret, François, Dutertre, Jean-Max, Robisson, Bruno, Tria, Assia |
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| Přispěvatelé: | Conception et Test de Systèmes MICroélectroniques (SysMIC), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Département Systèmes et Architectures Sécurisés (SAS-ENSMSE), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC, Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Le Bouder, Hélène |
| Jazyk: | angličtina |
| Rok vydání: | 2012 |
| Předmět: |
[INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR]
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Hardware_PERFORMANCEANDRELIABILITY [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics [INFO.INFO-CR] Computer Science [cs]/Cryptography and Security [cs.CR] |
| Zdroj: | CryptArchi: Cryptographic Architectures CryptArchi: Cryptographic Architectures, Jun 2012, St-Etienne, France |
| Popis: | International audience; The electromagnetic (EM) side channel is a well known source of information leakage. It may be used to conduct passive attacks in order to retrieve sensitive data handled by a secure device.However, the EM medium may also be used to conduct active attacks. Two kinds of near-field EM perturbations are usually considered: tran- sient pulses and harmonic emissions. We report in this talk our most recent results related to transient pulses. We provide a detailed in- sight into the use of two different techniques dedicated to the injec- tion of transient faults into a running circuit. Such faults permit us to mount successfully standard differential fault analysis against AES and DES. Fault injection experiments on microcontrollers, FPGA and ASICs will be describe. We also report first explanations on the fault injection mechanism. |
| Databáze: | OpenAIRE |
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