Compact Modeling of Single Event Latchup of integrated CMOS circuit
| Autor: | Al Youssef, Ahmad, Artola, Laurent, Ducret, S., Hubert, Guillaume |
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| Přispěvatelé: | ONERA / DPHY, Université de Toulouse [Toulouse], ONERA-PRES Université de Toulouse, SOFRADIR (Veurey-Voroize), André, Cécile, PRES Université de Toulouse-ONERA |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
SEE PREDICTION
COMPACT MODELING CMOS PRÉDICTION SEE [PHYS.PHYS.PHYS-SPACE-PH]Physics [physics]/Physics [physics]/Space Physics [physics.space-ph] SINGLE EVENT LATCHUP DESIGN [PHYS.PHYS.PHYS-PLASM-PH]Physics [physics]/Physics [physics]/Plasma Physics [physics.plasm-ph] [PHYS.PHYS.PHYS-PLASM-PH] Physics [physics]/Physics [physics]/Plasma Physics [physics.plasm-ph] TECHNOLOGY COMPUTER-AIDED DESIGN (TCAD) SIMULATION COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR (CMOS) TCAD SIMULATION SPICE SIMULATION [PHYS.PHYS.PHYS-SPACE-PH] Physics [physics]/Physics [physics]/Space Physics [physics.space-ph] SINGLE-EVENT LATCHUP (SEL) MODÉLISATION COMPACTE SIMULATION TCAD CROSS SECTION COMPLEMENTARY METAL– OXIDE–SEMICONDUCTOR |
| Zdroj: | RADECS 2018 RADECS 2018, Sep 2018, GOTEBORG, Sweden |
| Popis: | International audience; This paper presents a compact model of latchup taking into account design and process dependence. This model was used to confirm the SEL robustness of DFFs used in Readout Circuit of Infrared-sensors developed by Sofradir.ouThis paper presents a compact model of latchup considering design and process dependence. The new approach is more realistic and inspirited from the classical model. This model was used to confirm the single-event latchup (SEL) robustness of D-flip-flops (DFFs) used in Readout Circuit of Infrared-sensors developed by Sofradir. SEL cross sections are presented by the mean of the Monte Carlo tool MUSCA SEP3 in order to validate the new latchup modeling approach. |
| Databáze: | OpenAIRE |
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