Test Structures and Techniques for On-Wafer CMOS TRL Calibration

Autor: Jenner, Michael Bohl, Kolding, T. E.
Jazyk: angličtina
Rok vydání: 2001
Zdroj: Jenner, M B & Kolding, T E 2001, Test Structures and Techniques for On-Wafer CMOS TRL Calibration . in Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001 . pp. 137-140, Test Structures and Techniques for On-Wafer CMOS TRL Calibration, 19/05/2010 .
Databáze: OpenAIRE