Test Structures and Techniques for On-Wafer CMOS TRL Calibration
Autor: | Jenner, Michael Bohl, Kolding, T. E. |
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Jazyk: | angličtina |
Rok vydání: | 2001 |
Zdroj: | Jenner, M B & Kolding, T E 2001, Test Structures and Techniques for On-Wafer CMOS TRL Calibration . in Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 2001 . pp. 137-140, Test Structures and Techniques for On-Wafer CMOS TRL Calibration, 19/05/2010 . |
Databáze: | OpenAIRE |
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