Preliminary Study of Electronics Reliability in ITER Neutron Environment

Autor:	Dentan, Martin, Borgese, Gianluca, Autran, Jean-Luc, Munteanu, Daniela, Moindjie, Soilihi, Moreau, Philippe, Pellissier, Francis-Pierre, Santraine, Benjamin, Bucalossi, Jérôme, Roche, Philippe, Malherbe, Victor, Cecchetto, Matteo, Rubén, García Alía
Přispěvatelé:	ITER organization (ITER), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), CEA Cadarache, Commissariat à l'énergie atomique et aux énergies alternatives (CEA), STMicroelectronics [Crolles] (ST-CROLLES), CERN [Genève]
Jazyk:	angličtina
Rok vydání:	2022
Předmět:	fusion static random access memory (SRAM) neutron WEST real-time experiment ITER CMOS single event effects (SEE) [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics tokamak deuterium-deuterium (D-D) deuterium-tritium (D-T) single-event upset
Zdroj:	European Workshop on Radiation and its Effects on Components and Systems (RADECS 2022) European Workshop on Radiation and its Effects on Components and Systems (RADECS 2022), Oct 2022, Venise, Italy
Popis:	International audience; We validated a method for predicting the Soft Error Rate (SER) in the WEST tokamak operated with deuterium plasmas, and we applied it to predict the SER in the ITER tokamak operated with deuterium-tritium plasmas.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4b471d057e5f74d7d9e06b494a7460e3 https://amu.hal.science/hal-03735989 Zobrazit plný text záznamu