Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy

Autor:	Matei-lon Oprea, Sergiu Spataru, Dezso Sera, Ronni Basu, Andersen, Anders R., Peter Behrensdorff Poulsen
Jazyk:	angličtina
Rok vydání:	2016
Zdroj:	Oprea, M, Spataru, S, Sera, D, Basu, R, Andersen, A R & Poulsen, P B 2016, ' Detection of Potential Induced Degradation in c-Si PV Panels Using Electrical Impedance Spectroscopy ', 42nd IEEE Photovoltaic Specialists Conference, New Orleans, United States, 14/06/2015-19/06/2015 . Technical University of Denmark Orbit
Popis:	This work, for the first time, investigates an Impedance Spectroscopy (IS) based method for detecting potential-induced degradation (PID) in crystalline silicon photovoltaic (c-Si PV) panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to detect PID in PV panels.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::47ff887e51a4162c5c2d4889f9cfdb4f https://orbit.dtu.dk/en/publications/e8cf3aa2-0dd6-4c63-8397-c2cfffae5e38 Zobrazit plný text záznamu