Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
| Autor: | Seré, Pablo Ricardo, Zerbino, Jorge Omar, Maltz, Alberto Leonardo, Elsner, Cecilia Inés, Di Sarli, Alejandro Ramón |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: | |
| Zdroj: | SEDICI (UNLP) Universidad Nacional de La Plata instacron:UNLP |
| Popis: | Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores. Centro de Investigación y Desarrollo en Tecnología de Pinturas Instituto de Investigaciones Fisicoquímicas Teóricas y Aplicadas |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|