An imaging SIMS study on the tribological properties of boron carbide thin films

Autor: Tavsanoglu, Tolga, Jeandin, Michel, Addemir, Okan, Agirseven, Okan, Yucel, O.
Přispěvatelé: Centre des Matériaux (MAT), MINES ParisTech - École nationale supérieure des mines de Paris, Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: Surface and Interface Analysis
Surface and Interface Analysis, Wiley-Blackwell, 2013, 45, pp.587-591. ⟨10.1002/sia.5035⟩
ISSN: 0142-2421
1096-9918
DOI: 10.1002/sia.5035⟩
Popis: International audience; In this study, boron carbide thin films were deposited on AISI M2 grade high-speed steel substrates by plasma-enhanced DC magnetron sputtering of an 'in-house' produced boron carbide target material. Tribological properties of the coatings have been evaluated by a 'pin-on-disc' tribometer. Wear tracks on boron carbide thin films were investigated by scanning electron microscopy-energy dispersive spectroscopy, electron probe microanalysis and secondary ion mass spectrometry (SIMS) elemental ion imaging. The results of analyses provided information about the reliability of the SIMS ion imaging compared to the other investigation techniques on nano-layers and nano-sized thin films.
Databáze: OpenAIRE
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