The value of preoperative tests in the selection of blind patients for a permanent microelectronic implant

Autor:	Yanai, D., Lakhanpal, R. R., James Weiland, Mahadevappa, M., Boemel, G., Fujii, G. Y., Greenberg, R., Caffey, S., Juan Jr, E., Humayun, M. S., Puro, D. G., Wright, K. W., Gutman, F. A., Knox, D. L.
Zdroj:	Scopus-Elsevier
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::404a6e0a43eaa23296b1add9537883a9 http://www.scopus.com/inward/record.url?eid=2-s2.0-10744231253&partnerID=MN8TOARS Zobrazit plný text záznamu