Thin films thermal conductivity Measurement system based on pulsed photothermal radiometry and its application to industrial wear resistant films

Autor:	Martan, J., Beneš, P., Vladislav Lang
Zdroj:	Scopus-Elsevier
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3dafaf7978361b2a801a1ec19ae125b5 http://www.scopus.com/inward/record.url?eid=2-s2.0-62949189630&partnerID=MN8TOARS Zobrazit plný text záznamu