Extension of energy-resolved XPS towards a quantitative depth-profiling method and its application to ion-surface interactions
| Autor: | Köppen, ∙., Martin Oberkofler, Riesch, J., Schmid, K., Vollmer, A., Linsmeier, C. |
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| Zdroj: | BASE-Bielefeld Academic Search Engine |
| Databáze: | OpenAIRE |
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