Transport properties of CdSe nanocrystal superlattice
| Autor: | Capiod, Pierre, Berthe, Maxime, Grandidier, B., Evers, Wiel, Vanmaekelbergh, Daniel |
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| Přispěvatelé: | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Kavli Institute of Nanosciences [Delft] (KI-NANO), Delft University of Technology (TU Delft), Debye Institute for Nanomaterials Science, Utrecht University [Utrecht] |
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: | |
| Zdroj: | European Materials Research Society Spring Meeting, E-MRS Spring 2014, Symposium F-Established and emerging nanocolloids : from synthesis & characterization to applications European Materials Research Society Spring Meeting, E-MRS Spring 2014, Symposium F-Established and emerging nanocolloids : from synthesis & characterization to applications, 2014, Lille, France |
| Popis: | Two-dimensional materials exhibit exotic electronic properties and high specific surface areas that make them unique to investigate novel physical phenomena. In addition, their two-dimensional geometry is directly compatible with established design and processing approaches from the semiconductor industry and such an asset has motivated numerous applications in sensing, catalysis and energy storage. Recent achievements in wet-chemical semiconductor fabrication have demonstrated that two-dimensional single crystalline sheets can be synthesized from nanocrystalline colloids, where the nanocrystal facets are atomically bonded. As a result, the sheets show a super periodicity with a square or a honeycomb geometry, that make their electronic structure quite unique. Here, we report on the investigation of the transport properties of CdSe sheets with multiple probe scanning tunneling microscopy in ultra high vacuum. By performing four-point probe measurements, we are able to determine the conductivity of the sheets with dimensions exceeding a few micrometers. We also find a change of the conductivity as a gate voltage is applied to the underlying substrate. Key transport parameters, such as the free carrier concentration and the mobility are deduced from these measurements and their magnitude will be discussed in light of the structural properties of the sheets. |
| Databáze: | OpenAIRE |
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