Characterization of SbSI nanocrystals by electron microscopy, X-ray diffraction and Raman scattering

Autor:	Ivan Voynarovych, Gomonnai, A. V., Solomon, A. M., Azhniuk, Yu M., Kikineshi, A. A., Pinzenik, V. P., Kis-Varga, M., Daroczy, L., Lopushansky, V. V.
Zdroj:	Scopus-Elsevier
Databáze:	OpenAIRE
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