High-Resolution X-Ray Diffraction Investigations of Silicon Grown by the Float-Zone Method
| Autor: | Molodkin, V. B., Ando, M., Kislovskii, E. N., Stephan Olikhovskii, Vladimirova, T. P., Reshetnyk, O. V., Len, E. G., Evgrafova, E. A., Pervak, E. V. |
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| Zdroj: | Scopus-Elsevier |
| Databáze: | OpenAIRE |
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