Far-field beam pattern technique for high pointing accuracy characterization of GUSTO HEB mixer arrays

Autor:	Silva, J. R., Yates, S., Wouter Laauwen, Finkel, M., Gao, J. R.
Jazyk:	angličtina
Rok vydání:	2019
Zdroj:	2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019. Gothenburg, Sweden 2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019 Scopus-Elsevier
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::237fae4bc6458a5617404143016c04f5 http://resolver.tudelft.nl/uuid:0bf776e9-e77b-47f8-a2b8-ffb3b5ed1803 Zobrazit plný text záznamu