An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy
| Autor: | Suproniuk, M., Kaminski, P., Miczuga, M., Pawlowski, M., Kozlowski, R., Longeaud, Christophe, Kleider, Jean-Paul |
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| Přispěvatelé: | Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), SCM - Equipe Semiconducteurs en Couches Minces, Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2009 |
| Zdroj: | Przeglad Elektrotechniczny Przeglad Elektrotechniczny, 2009, 11/2009, pp.93-98 Przeglad Elektrotechniczny, Wydawnictwo Czasopism i Ksia̜żek Technicznych Sigma, 2009, pp.93-98 |
| ISSN: | 0033-2097 2449-9544 |
| Popis: | International audience; An intelligent measurement system for diagnosing of semi-insulating materials by photoinduced transient spectroscopy has been presented. The system utilises two-dimensional analysis of the photocurrent transients digitally recorded in a broad range of temperatures for determination of defect centers parameters and a simulation procedure for calculation their concentration. The system is shown to be a powerful tool for studies of defect structure of high-resistivity semiconductors. |
| Databáze: | OpenAIRE |
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