A novel test scheme for detecting faulty recall margin cells for 6T-4C FeRAM

Autor:	Uneki, Yohei, Izumi, Shintaro, Kitahara, Hiroto, Nakagawa, Tomoki, Yanagida, Koji, Yoshimoto, Shusuke, Kawaguchi, Hiroshi, Yoshimoto, Masahiko, Kimura, Hiromitsu, Marumoto, Kyoji, Fuchikami, Takaaki, Fujimori, Yoshikazu
Jazyk:	angličtina
Rok vydání:	2016
Zdroj:	Memoirs of the Graduate Schools of Engineering and System Informatics Kobe University. 8:1-4
ISSN:	2185-5110
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::06c90b8297dca0c9c5ee4f10bda01dd4 http://www.lib.kobe-u.ac.jp/handle_kernel/81009697 Zobrazit plný text záznamu