Evaluation of computer display systems using digital test patterns

Autor:	Miller, T. R., Sampathkumaran, K., Biello, D. R., Michael Vannier
Zdroj:	Scopus-Elsevier DOE / OSTI
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::04527c394cbfa00bf72ea00551fc8af5 http://www.scopus.com/inward/record.url?eid=2-s2.0-0019850212&partnerID=MN8TOARS Zobrazit plný text záznamu