Extended analysis of the Z²-FET: operation as capacitorless eDRAM

Autor: Navarro, Carlos, Lacord, Joris, Parihar, Mukta Singh, Adamu-Lema, Fikru, Duan, Meng, Rodriguez, Noel, Cheng, Binjie, El Dirani, Hassan, Barbe, Jean-Charles, Fonteneau, Pascal, Bawedin, Maryline, Millar, Campbell, Galy, Philippe, Le Royer, Cyrille, Karg, Siegfried, Wells, Paul, Kim, Yong-Tae, Asenov, Asen, Cristoloveanu, Sorin, Gamiz, Francisco
Jazyk: angličtina
Rok vydání: 2017
Předmět:
ISSN: 0018-9383
Popis: The Z²-FET operation as capacitorless DRAM\ud is analyzed using advanced 2-D TCAD simulations for IoT\ud applications. The simulated architecture is built based on\ud actual 28-nm fully depleted silicon-on-insulatordevices. It is\ud found that the triggering mechanism is dominated by the\ud front-gate bias and the carrier’s diffusion length. As in other\ud FB-DRAMs, the memory window is defined by the ON voltage\ud shift with the stored body charge. However, the Z²-FET’s\ud memory state is not exclusively defined by the inner charge\ud but also by the reading conditions.
Databáze: OpenAIRE