| Autor: |
Al-Ameri, Talib, Georgiev, V.P., Adamu-Lema, F., Asenov, A. |
| Jazyk: |
angličtina |
| Rok vydání: |
2017 |
| Zdroj: |
International Workshop on Computational Nanotechnology |
| Popis: |
In this work, we investigated the performance of vertically stacked lateral nanowires transistors (NWTs) considering the effects of series resistance. Also, we consider the vertical positions of the lateral nanowires in the stack and diameter variation of the lateral NWTs as new sources of process variability. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
