| Autor: |
Kim, J-Y., Ionescu, A., Mansell, R., Farrer, I., Oehler, F., Kinane, C.J., Cooper, J.F.K., Steinke, N-J., Langridge, S., Stankiewicz, R., Humphreys, C.J., Cowburn, R.P., Holmes, S.N., Barnes, C.H.W. |
| Jazyk: |
angličtina |
| Rok vydání: |
2017 |
| ISSN: |
0021-8979 |
| Popis: |
Structural and magnetic properties of 1-10 nm thick Fe films deposited on GaN(0001) were investigated. In-situ reflecting high energy electron diffraction images indicated a α-Fe(110)/GaN(0001) growth of the 3D Volmer-Weber type. The α-Fe(110) XRD peak showed a 1° full-width at half-maximum, indicating ≈ 20 nm grain sizes. A significant reduction in Fe atomic moment from its bulk value was observed for films thinner than 4 nm. Both GaN/Fe interface roughness and Fe film coercivity increased with Fe thickness, indicating a possible deterioration of Fe crystalline quality. Magnetic anisotropy was mainly uniaxial for all films while hexagonal anisotropies appeared for thicknesses higher than 3.7 nm. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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