Bayesian derivation of electron temperature profile using JET ECE diagnostics

Autor:	Schmuck S., Svensson J., de la Luna E., Figini L., Johnson T., Alper B., Beurskens M., Fessey J., Gerbaud T., Sirinelli A., JET EFDA Contributors
Jazyk:	angličtina
Rok vydání:	2011
Předmět:	____
Zdroj:	38th EPS Conference on Plasma Physics, Strasbourg, France, 27 June-1 July 2011 info:cnr-pdr/source/autori:Schmuck S.; Svensson J.; de la Luna E.; Figini L.; Johnson T.; Alper B.; Beurskens M.; Fessey J.; Gerbaud T.; Sirinelli A.; and JET EFDA Contributors/congresso_nome:38th EPS Conference on Plasma Physics/congresso_luogo:Strasbourg, France/congresso_data:27 June-1 July 2011/anno:2011/pagina_da:/pagina_a:/intervallo_pagine
Popis:	____
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=cnr_________::81d82cdecbf67bce429b66a004e7cdbc http://ocs.ciemat.es/EPS2011PAP/pdf/P5.046.pdf Zobrazit plný text záznamu