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Application of the amorphous alloys in technology is strongly affected by their thermomechanical properties. These properties are also dependent on the preparation of the amorphous alloys. For this reason, amorphous AI-TE alloys where prepared by the magnetron deposition far from the equilibrium conditions. Structural relaxation of amorphous thin films under isochronal condition was examined by continuous in situ electrical resistance measurements in vacuum, while the stress of the films were determined from the substrate deformation by the profilmeter, and the microhardness (load 2mN) was examined by the micro- and nano-hardness device. Simple empirical linear relationship between the Vickers hardness, and elastic energy fraction of indentation deformation was established. This elastic energy fraction is compared with the activation energy of relaxation and crystallization derived from the Ginzburg-Landau theory of phase transformation and the adaptation of the JMA model for the non- isothermal kinetics. Comparison between some of the characteristic electrical parameters (resistivity, TCR), and the characteristic mechanical properties (elastic energy, Young modulus) also yields some interesting correlations across the range of the films composition. |
