| Autor: |
Stampanoni, Marco, Groso, Amela, Abela, Rafael, Lange, Michael, Zelenika, Saša |
| Jazyk: |
angličtina |
| Rok vydání: |
2004 |
| Předmět: |
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| Popis: |
The X-Ray Tomopgraphic Microscopy (XTM) station of the Materials Science Beamline has been routinely operated for user's experiments. During the last year several important improvements were made in the beamline diagnostics, user-frendliness, data acqusition, data pre- and post-processing, data visualization and data archiving. Here we present the most relevant ameliorations as well as the interventions planned for the immediate future. At the same time, the design of the new XTM dedicated beamline has been started and the most critical components have been either already ordered or are currently being defined. The novel beamline will be located at the X02DA port of the SLS and will receive photons from a 3.1 T superbend. The white beam will be filtered by a fixed-exit double-crystal-multilayer monochromator (DCMM) covering an energy range from 8 to 45 keV with variable bandwith. The standard SLS front-end design has been modified in order to accommodate the DCMM at a very short distance from the source, resulting in a smaller, more stable and more performing optic. An updated version of the present XTM microscope will be installed at 20 m from the source: this distance can be increased up to 30 m in order to fully exploit the coherence properties of the source. In this work the major components of the new beamline will be described. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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