Characterization of semiconductor water surfaces by light scattering topography
| Autor: | Molarius, Jyrki, Ronkainen, Hannu, Henelius, N., Anttila, Olli, Tilli, Markku |
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| Přispěvatelé: | Gislason, Haflidi P., Gudmundsson, Vidar, Xander, Gerlinde |
| Jazyk: | angličtina |
| Rok vydání: | 1994 |
| Zdroj: | Molarius, J, Ronkainen, H, Henelius, N, Anttila, O & Tilli, M 1994, Characterization of semiconductor water surfaces by light scattering topography . in H P Gislason, V Gudmundsson & G Xander (eds), 16th Nordic Semiconductor Meeting. Laugarvatn : Abstracts . University of Iceland, Reykjavík, pp. 113, 16th Nordic Semiconductor Meeting, Laugarvatn, Iceland, 12/06/94 . |
| Databáze: | OpenAIRE |
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