Thermal Stability of Normal Incidence Multilayer Mirrors for the X-Ray Wavelength near CarbonK-Edge

Autor: BUGAEV, E.A., FEDORENKO, A.I., KONDRATENKO, V.V., ZUBAREV, E.N.
Zdroj: Journal of X-Ray Science and Technology; September 1995, Vol. 5 Issue: 3 p295-306, 12p
Abstrakt: Annealing effects in the short-period multilayers Cr3C2/C, TiC/C, Cr3C2/(B + C), and CrB2/C were studied in a wide temperature range ∼200–1200°C by x-ray scattering and cross-sectional electron microscopy. It was shown that the thermodynamic equilibrium of the layer materials at their interfaces and stabilization of layer structure by impurities and heat treatment are effective approaches to short-period multilayers with enhanced thermal stability of their structure and optical properties.
Databáze: Supplemental Index