| Autor: |
Wang, H., Zhou, Y.S., Chen, X., Liang, B.Q., Tang, Y.J., Zhao, H.W., Zhan, W.S., Wang, A.L., Zheng, W., Chen, J.C. |
| Zdroj: |
Physica Status Solidi (A) - Applications and Materials Science; June 2000, Vol. 179 Issue: 2 p429-435, 7p |
| Abstrakt: |
A series of sputtered Pt/Co/Pt/Ni multilayers with Ni layer thickness tNi ranging from 0 to 2.4 nm were prepared. An increase of Kerr rotation and reflectivity was obtained in the wavelength range of 360 to 800 nm. The remanence ratio Mr/Ms is kept as unity until a Ni thickness of up to 1.8 nm. The relationship between conductivity tensors σ1xx, σ2xx, σ1xy, σ2xy and tNi were calculated with measured values of Kerr rotation, ellipticity and complex optic constants. Furthermore, θK = θK[σ1xx(tNi), σ2xx(tNi), σ1xy(tNi), σ2xy(tNi)] as a compound function of tNi was calculated. It exhibits that, with changing of tNi, σ2xy is the major factor to influence θK at short wavelengths and all of four conductivity tensors are important at long wavelengths, no one is negligible. In general, there is no simple relationship between Δσij and δθK. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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