| Autor: |
Zografopoulos, Dimitrios C., Dionisiev, Irnik, Minev, Nikolay, Petrone, Gaetana, Maita, Francesco, Maiolo, Luca, Dimitrov, Dimitre, Marinova, Vera, Liscio, Andrea, Mussi, Valentina, Beccherelli, Romeo, Fuscaldo, Walter |
| Zdroj: |
IEEE Transactions on Antennas and Propagation; December 2024, Vol. 72 Issue: 12 p9301-9316, 16p |
| Abstrakt: |
A protocol for the characterization of thin conducting films (TCSs) by means of terahertz time-domain spectroscopy (THz-TDS) is thoroughly presented. By employing a Gires-Tournoisétalon configuration in the reflection mode, it is shown that amplitude-only measurements are sufficient to accurately characterize the sheet resistance of thin films at THz frequencies thanks to the high sensitivity of the proposed technique. A large series of samples of nanometric thickness that span a broad range of sheet resistance values are characterized: fluorine-doped zinc oxide, aluminum-doped zinc oxide, nanometric titanium and reduced graphene oxide films, and tungsten and platinum diselenide. In addition, a flexible THz perfect absorber based on a Salisbury screen is experimentally demonstrated in the context of the analysis. The results confirm that THz-TDS in the reflection mode provides a powerful tool for the fast and nondestructive characterization of TCSs, such as transparent conducting oxides and emerging 2-D materials. |
| Databáze: |
Supplemental Index |
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