Assessing substrate quality and contamination of thin film coatings for x-ray optics
| Autor: | den Herder, Jan-Willem A., Nikzad, Shouleh, Nakazawa, Kazuhiro, Paredes-Sanz, D., Massahi, S., Svendsen, S., Ferreira, D. D. M., Martins, R., Gellert, N. C., 'S Jegers, A., Landgraf, B., Thete, A., Ferreira, I., Bavdaz, M., Girou, D., Collon, M., Christensen, F. E. |
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| Zdroj: | Proceedings of SPIE; August 2024, Vol. 13093 Issue: 1 p130935C-130935C-13, 12962579p |
| Databáze: | Supplemental Index |
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