Reliable post-production characterization approach to TiO2/SiO2electron-beam optical coatings based on multi-sample photometric and ellipsometric data
| Autor: | Lequime, Michel, Ristau, Detlev, Amochkina, Tatiana, Trubetskov, Michael, Janicki, Vesna, Sancho-Parramon, Jordi |
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| Zdroj: | Proceedings of SPIE; June 2024, Vol. 13020 Issue: 1 p130200S-130200S-8, 1171809p |
| Databáze: | Supplemental Index |
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