Reliability evaluation of a digital pulse-driven 160kV carbon nanotube-based x-ray source for cell irradiation

Autor: Fahrig, Rebecca, Sabol, John M., Li, Ke, Lee, Hanna, Choi, Jinho, Sharma, Mrinal Bhusal, Jung, Jaeik, Jang, Jaekyu, Yoon, Kyung-Sik, Ryu, Jehwang
Zdroj: Proceedings of SPIE; April 2024, Vol. 12925 Issue: 1 p1292545-1292545-7
Databáze: Supplemental Index