Life cycle assessment of etching processes for FDSOI transistors technologies

Autor: Mohanty, Nihar, Altamirano-Sánchez, Efrain, Renaud, Mickaël, Sarrazin, Aurélien, Lopes-Barbosa, Joao, Rivoira, Yannick, Servin, Isabelle, Boulard, François
Zdroj: Proceedings of SPIE; April 2024, Vol. 12958 Issue: 1 p129580K-129580K-11, 12828432p
Databáze: Supplemental Index