Simulating SEM imaging of via bottoms

Autor: Sendelbach, Matthew J., Schuch, Nivea G., Bunday, Benjamin D., Mack, Chris, Klotzkin, Shari, Patriarche, Douglas, Ball, Yvette
Zdroj: Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129551T-129551T-13, 12825563p
Databáze: Supplemental Index