Robustness and reliability of high-power white LEDs under high-temperature, high-current stress

Autor: Kim, Jong Kyu, Krames, Michael R., Strassburg, Martin, Caria, A., Fraccaroli, R., Pierobon, G., Castellaro, T., Mura, G., Ricci, P. C., De Santi, C., Buffolo, M., Trivellin, N., Zanoni, E., Meneghesso, G., Meneghini, M.
Zdroj: Proceedings of SPIE; March 2024, Vol. 12906 Issue: 1 p129060T-129060T-7, 1161548p
Databáze: Supplemental Index