Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material

Autor: Liu, Weiguo, Wang, Wei, Zhu, Yechuan, Lei, Jiamiao, Liu, Wenxuan, Tuo, Yicheng, Hanson, Steen G., Takeda, Mitsuo, Wang, Wei
Zdroj: Proceedings of SPIE; March 2024, Vol. 13070 Issue: 1 p130700Z-130700Z-5, 1176306p
Databáze: Supplemental Index