Improvement of microtubule defects of SiC substrate through a thermal effect control method

Autor: Lu, Yuan, Fu, Yabo, Shen, Xiaoyu, Li, Jiawei, Yeh, Kuowei, Xue, Yanpeng, Ozoemena, Kenneth Ikechukwu, Gluche, Peter, Chang, Chung Chieh, Zhu, Boang
Zdroj: Proceedings of SPIE; February 2024, Vol. 13068 Issue: 1 p130680T-130680T-4, 1176125p
Databáze: Supplemental Index