Resist pattern damage caused by electrostatic charge

Autor: Ban, Taketora, Kanemitsu, Hideyuki, Miyazono, Yusei, Miyahara, Yutaka, Yoshizawa, Takeshi, Furukawa, Takao
Zdroj: Proceedings of SPIE; October 2023, Vol. 12812 Issue: 1 p128120B-128120B-10, 12683891p
Databáze: Supplemental Index