| Autor: |
Repins, Ingrid L., Deceglie, Michael G., Silverman, Timothy J., Miller, David C., Jordan, Dirk C., Woodhouse, Mike, Barnes, Teresa M. |
| Zdroj: |
IEEE Journal of Photovoltaics; January 2024, Vol. 14 Issue: 1 p46-52, 7p |
| Abstrakt: |
A forward-looking research opportunity number (RON) is defined for photovoltaic reliability researchers. The RON enables researchers to prioritize their efforts toward the highest impact. For a given degradation mode, the RON is based on three factors: the effect on levelized cost of electricity, the susceptibility of future module products, and the maturity of accelerated tests that can detect and quantify the mode. Reporting bias is avoided because the RON does not rely on polls. The RON is derived for three example cases: light and elevated temperature degradation, backsheet cracking, and antireflective coating abrasion. These examples demonstrate that targeted research has reduced the risk for these modes over the last several years. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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