Deep learning-based depth map defect removal for industrial applications
| Autor: | Han, Sen, Ehret, Gerd, Chen, Benyong, Voronin, V., Gapon, N., Zhdanova, M., Tokareva, O., Khamidullin, I., Semenishchev, E. |
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| Zdroj: | Proceedings of SPIE; November 2023, Vol. 12769 Issue: 1 p127691Q-127691Q-11, 12641421p |
| Databáze: | Supplemental Index |
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