Deep learning-based image defect detection and removal in manufacturing
| Autor: | Kress, Bernard C., Czarske, Jürgen W., Gapon, N., Voronin, V., Zhdanova, M., Sizyakin, R., Semenishchev, E., Ilyukhin, Yu |
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| Zdroj: | Proceedings of SPIE; August 2023, Vol. 12624 Issue: 1 p126241Q-126241Q-9, 1136179p |
| Databáze: | Supplemental Index |
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