Non-integral model-based scatterometry for single-structure OCD metrology

Autor: Bodermann, Bernd, Frenner, Karsten, Barnes, Bryan M., Chein, Wei-Hsin, Yang, Fu-Sheng, Fu, Zi-Ying, Chen, Liang-Chia
Zdroj: Proceedings of SPIE; August 2023, Vol. 12619 Issue: 1 p126190H-126190H-9, 1135720p
Databáze: Supplemental Index