Probabilistic-Bits Based on Ferroelectric Field-Effect Transistors for Probabilistic Computing

Autor: Luo, Sheng, He, Yihan, Cai, Baofang, Gong, Xiao, Liang, Gengchiau
Zdroj: IEEE Electron Device Letters; August 2023, Vol. 44 Issue: 8 p1356-1359, 4p
Abstrakt: A probabilistic bit (p-bit) is the fundamental building block in the circuit of probabilistic computing (PC), and it produces a random binary bitstream with tunable probability. Utilizing the randomness induced by thermal noise-induced lattice vibration in the ferroelectric (FE) material, we propose the p-bits based on stochastic ferroelectric FET (FeFET). The domain dynamic is revealed to play crucial roles in FE p-bits’ stochasticity, as the domain coupling suppresses the dipole fluctuation. The proposed FE p-bits possess the advantages of both extremely low hardware cost and scalability for p-bit circuitry, rendering it a promising candidate for PC.
Databáze: Supplemental Index