Light and elevated temperature induced degradation in gallium- and boron-doped hpmc-Si wafers studied by hyperspectral photoluminescence imaging
| Autor: | Mehl, Torbjørn, Berge, Oda Goa, Burud, Ingunn, Søndenå, Rune, Olsen, Espen |
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| Zdroj: | AIP Conference Proceedings Online; June 2023, Vol. 2826 Issue: 1 p030007-30011, 5p |
| Databáze: | Supplemental Index |
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