Defect detection algorithm of lightweight chip based on improved YOLOv5s

Autor: Khan, Zeashan Hameed, Balas, Valentina E., Chen, Lei, Yao, Keming, Jiang, Shaozhong, Wang, Zhongzhou, Guo, Fuao
Zdroj: Proceedings of SPIE; May 2023, Vol. 12700 Issue: 1 p1270021-1270021-7
Databáze: Supplemental Index