Defect detection algorithm of lightweight chip based on improved YOLOv5s
Autor: | Khan, Zeashan Hameed, Balas, Valentina E., Chen, Lei, Yao, Keming, Jiang, Shaozhong, Wang, Zhongzhou, Guo, Fuao |
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Zdroj: | Proceedings of SPIE; May 2023, Vol. 12700 Issue: 1 p1270021-1270021-7 |
Databáze: | Supplemental Index |
Externí odkaz: |