Characterization of TSV etch from a sustainability standpoint

Autor: Mohanty, Nihar, Altamirano-Sánchez, Efrain, Isowamwen, Osakpolo, Marchack, Nathan, Koty, Devi, Yang, Qingyun, Nguyen, Hien, Molis, Steve, Lefevre, Scott, Hopstaken, Marco, Metz, Andy, Shearer, Jeff, Bruce, Robert L.
Zdroj: Proceedings of SPIE; May 2023, Vol. 12499 Issue: 1 p124990H-124990H-8, 1124919p
Databáze: Supplemental Index