Scaled-down deposited underlayers for EUV lithography

Autor: Guerrero, Douglas, Amblard, Gilles R., Gupta, Mihir, Antunes Afonso, Joao, Bezard, Philippe, Vallat, Remi, Fallica, Roberto, Suh, Hyo Seon, Halder, Sandip, De Simone, Danilo, Liu, Zecheng, Ran, Fanyong, Fukuda, Hideaki, Sun, Yiting, De Roest, David, Piumi, Daniele
Zdroj: Proceedings of SPIE; May 2023, Vol. 12498 Issue: 1 p124980R-124980R-6, 1124827p
Databáze: Supplemental Index