Pattern fidelity improvement of DSA hole patterns

Autor: Liddle, J. Alexander, Ruiz, Ricardo, Muramatsu, Makoto, Nishi, Takanori, Ito, Kiyohito, Takahashi, Yoshihito, Hatamura, Yasunori, Kitano, Takahiro, Iwaki, Tomohiro
Zdroj: Proceedings of SPIE; May 2023, Vol. 12497 Issue: 1 p124970J-124970J-10, 12372041p
Databáze: Supplemental Index